Using Adaptive Scanning Strategies

Not every user with access to scanning hardware is an expert and understands how to configure various controlling parameters that affect accuracy and throughput such as scan speed, point density, and offset force. With Adaptive Scanning, you don't need to be an expert, since it removes the guesswork out of configuring such scanning parameters. Adaptive Scanning uses a system comprised of expert knowledge to calculate those parameters based on known inputs, such as tolerance, feature type and size, stylus length, and surface finish. You only need to supply the information known to you. The Adaptive Scanning algorithms perform the work of choosing the other settings.

Adaptive Scanning is "controller aware". This means that if a certain capability exists on a controller that will improve the scanning accuracy and throughput, the software automatically uses those capabilities as needed.

The measurement strategies for the Adaptive Scanning feature are available only for an analog tip.

The strategies are located on the Measurement Strategies tab in the Probe Toolbox. The strategies are:

• Circle Auto Feature:

• Adaptive Circle Scan strategy

• Cone Auto Feature:

• Adaptive Cone Concentric Circle Scan strategy

• Adaptive Cone Line Scan strategy

• Cylinder Auto Feature:

• Adaptive Cylinder Line Scan strategy

• Adaptive Cylinder Spiral Scan strategy

• Line Auto Feature:

• Adaptive Linear Scan strategy

• Plane Auto Feature:

• Adaptive Free Form Plane Scan strategy

• Adaptive Plane Circle Scan strategy

• Adaptive Plane Line Scan strategy

For complete information about selecting and using measurement strategies, see "Working with Measurement Strategies".