You can use the ESF command to create features for the measuring principles that are supported by the Analysis Application (Messtechnik-Applikation, or MTA). These measuring principles are a subset of the available measuring principles. The table below lists the features that PC-DMIS supports.
Measuring Principle |
Type |
Supported Features |
Point |
Tactile and optical | AA, AC |
Contour |
Shape points |
BA |
Highest point |
BF, BH, BM, BN, BP |
|
Trim |
BK |
|
Optical |
BA, BD, BF, BK, BH, BM, BN, BP |
|
Hole |
In a planar surface punched normal to the surface |
CA, DG, EG, GA, HA, IG |
In a planar surface punched not normal to the surface |
CB, DH, EH, GB, HB, IH |
|
In a curved surface |
CD, DI, EI, GD, HD, II |
|
Optical and Optical NM |
CA, DG, EG, GA, HA, IG, CB, DH, EH, GB, HB, IH |
|
Standard Part |
Can be probed |
LA, LB, LC, LD |
Cannot be probed |
LE, LF, LG |
|
Optical |
LA, LB, LC, LD, LE, LF, LG, LH |
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