About the ESF Command

You can use the ESF command to create features for the measuring principles that are supported by the Analysis Application (Messtechnik-Applikation, or MTA). These measuring principles are a subset of the available measuring principles. The table below lists the features that PC-DMIS supports.

Measuring Principle	Type	Supported Features
Point	Tactile and optical	AA, AC
Contour	Shape points	BA
	Highest point	BF, BH, BM, BN, BP
	Trim	BK
	Optical	BA, BD, BF, BK, BH, BM, BN, BP
Hole	On a planar surface punched normal to the surface	CA, DG, EG, GA, HA, IG
	On a planar surface punched not normal to the surface	CB, DH, EH, GB, HB, IH
	On a curved surface	CD, DI, EI, GD, HD, II
	Optical and Optical NM	CA, DG, EG, GA, HA, IG, CB, DH, EH, GB, HB, IH, CK, DK, EK, GK, HK, IK
Standard Part	Can be probed	LA, LB, LC, LD
	Cannot be probed	LE, LF, LG
	Optical	LA, LB, LC, LD, LE, LF, LG, LH
Flush	Optical	NA
Gap	Optical	MA, MB, MC, MD

Using the ESF Module

Creating an ESF Command

Using the Icons

Global Application Settings dialog box