About the ESF Command

You can use the ESF command to create features for the measuring principles that are supported by the Analysis Application (Messtechnik-Applikation, or MTA). These measuring principles are a subset of the available measuring principles. The table below lists the features that PC-DMIS supports.

Measuring Principle

Type

Supported Features

Point

Tactile and optical

AA, AC

Contour

Shape points

BA

Highest point

BF, BH, BM, BN, BP

Trim

BK

Optical

BA, BD, BF, BK, BH, BM, BN, BP

Hole

On a planar surface punched normal to the surface

CA, DG, EG, GA, HA, IG

On a planar surface punched not normal to the surface

CB, DH, EH, GB, HB, IH

On a curved surface

CD, DI, EI, GD, HD, II

Optical and Optical NM

CA, DG, EG, GA, HA, IG, CB, DH, EH, GB, HB, IH, CK, DK, EK, GK, HK, IK

Standard Part

Can be probed

LA, LB, LC, LD

Cannot be probed

LE, LF, LG

Optical

LA, LB, LC, LD, LE, LF, LG, LH

Flush Optical NA
Gap Optical MA, MB, MC, MD

More:

Using the ESF Module

Creating an ESF Command

Using the Icons

Global Application Settings dialog box